Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)

ABSTRACT

The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.

RELATED APPLICATION (PRIORITY CLAIM)

This patent application is a divisional of U.S. patent application Ser.No. 11/679,031, filed on Feb. 1, 2007, which is a divisional of U.S.patent application Ser. No. 11/028,695, filed on Jan. 4, 2005, now U.S.Pat. No. 7,203,877.

BACKGROUND

The invention generally applies to the test and analysis of IntegratedCircuit devices.

The inherent software and hardware architecture of many Automatic TestEquipment (ATE) platforms do not allow for pauses during the executionof serialized SCAN based tests. However, many of the failure analysistechniques require the ability to pause on a test, such as SCAN, inorder to perform many of the tasks associated with a root cause failureanalysis. For example, in order to collect electrical currentmeasurements on pattern vectors the test must be paused at each vector,the device under test is conditioned as desired, and then an electricalcurrent measurement is made. The test is then resumed, the next vectoris executed, the test is paused, the device under test is conditioned asdesired, and then an electrical current measurement is made, and soforth.

Currently, SCAN based patterns use a combination of parallel and serialvectors in order to reduce the amount of memory used on many ATEplatforms. Typically, an ATE platform will provide the ability to pauseon a parallel vector, so one method of pausing on serial vectors of aSCAN based test is to convert the serial vectors into parallel vectors.This existing approach of converting the serialized vectors to parallelvectors, however, has a number of disadvantages.

First of all, when the serial vectors in a SCAN pattern are converted toparallel vectors, the pattern becomes very large. Many times the patternbecomes so large that it will not fit into the tester's parallel vectormemory. Therefore, the method will not work. At other times, the patternwill fit, but the other patterns in the test program have to be removedto make room for the converted SCAN pattern. This requires extensivemodifications to the test program.

Second, converting the serialized vectors to parallel vectors and thenmodifying the test program to accommodate them is typically outside theexpertise of the typical personnel who are responsible for failureanalysis tasks. Therefore, this method is seldom used because of theinherent problems it creates on tester resources and test program code.

Third, once the serial vectors are converted, the patterns must berecompiled, the test program must be modified, and, if there are severalSCAN patterns failing, these tasks are required for each failingpattern. This effort becomes very time consuming and often timesrequired the assistance of a Test Engineer. Therefore, it is both costlyand impacts the cycle time required to complete the failure analysis ona device.

Device simulations are used by integrated circuit design engineers togenerate patterns that are used in the test of a device. However, due todesign and logic layouts there are areas of a device that cannot besimulated. This leads to a decrease in the test fault coverage that inturn leads to devices that pass all production test flows, but fail inthe customer applications.

In order to solve this problem, sometimes there are opportunities tore-simulate a design to increase the fault coverage. However, in manycases the logic cannot be simulated. Another alternative is to re-spinthe design to add logic that allows for additional simulation, but thisisn't always practical and is seldom done.

These existing approaches, however, has a number of disadvantages.First, re-simulation and redesign are very costly. Second, re-simulationand re-design can take many months to accomplish, which is unacceptablein a time-to-market environment. Third, re-simulation and re-design arenot always successful. Fourth, re-designing a part can lead to otherproblems. In other words, sometimes the new design doesn't work andanother re-spin is required.

A current computer program has been designed to function on the Credenceautomatic test equipment (ATE) platform, however, the features providedby the software can be written to work across different ATE platforms.The program provides the ability to curve trace the input and output pin(buffer) characteristics of a device under test. This is also known ascurve tracing. The program is incorporated into the test program and usethe standard Credence ATE test and debugger elementals to characterizethe buffers and then stores the data for further analysis. Thiseliminates the need to use additional offline equipment to characterizeand curve trace device buffers. The program provides the option ofeither viewing the curve traces during a tester session using thestandard UNIX 2D plot routine (GNUPLOT) or an offline software packagesuch as Microsoft EXCEL. Of course, other graphic packages exist thatcould utilize the data as well. The program also provides the capabilityto store data that can then be evaluated using offline statistical andmathematically analysis packages to evaluate and characterize thebuffers. Thus, the program offers the ability to curve trace buffersduring a test session and then store the data for offline evaluation.

The known approach for solving this problem is oscilloscopes, which areused to curve trace. Oscilloscopes, though, are cumbersome to use whenlarge numbers of buffers are to be examined. Oscilloscopes are lackingfor a number of different reasons. In particular, oscilloscopes: do notautomatically curve trace a user defined pin list; do not utilize theexisting automatic test equipments hardware and software utilities; mustbe manually set up for each pin which can be very time consuming andcostly; do not provide a data file for a group of pins that can beanalyzed offline; do not provide an interface to the existing UNIXgnuplot utility; do not provide test limit and alarming capability; anddo not provide an operator interface that resides in the ATE testprograms flow.

OBJECTS AND SUMMARY

A primary object of an embodiment of the invention is to provide thecapability to pause on any link within a chain on any ATE that utilizeslooping and SCAN memory.

Another primary object of an embodiment of the invention is to providethe capability to pause on any link in a SCAN pattern, but which doesnot require any permanent changes to the SCAN pattern or test programflow.

Yet another primary object of an embodiment of the invention is that ituses the stimulations and responses of a known good device to increasethe fault coverage of the patterns in the test flow by changing thepatterns to include additional strobes in the pattern vectors that couldnot be determined during simulations.

Still another primary object of an embodiment of the invention is toprovide the availability to easily and automatically curve trace devicebuffers on an ATE.

Briefly, and in accordance with the foregoing, the invention provides anumber of related methods which improve the test and analysis ofintegrated circuit devices. A first method of the invention provides amethod for pausing on a SCAN based test. A second method of theinvention provides a method for using stimulations and responses of aknown good device to increase fault coverage of patterns in a test flow.A third method of the invention provides a method to curve trace devicebuffers on an ATE.

BRIEF DESCRIPTION OF THE DRAWINGS

The features of the invention which are believed to be novel aredescribed in detail hereinbelow. The organization and manner of thestructure and operation of the invention, together with further objectsand advantages thereof, may best be understood by reference to thefollowing description taken in connection with the accompanying drawingswherein like reference numerals identify like elements in which:

FIG. 1 illustrates a flow chart depicting a first method of theinvention;

FIG. 2 illustrates a flow chart depicting a second method of theinvention; and

FIG. 3 illustrates a flow chart depicting a third method of theinvention.

DESCRIPTION

While the invention may be susceptible to embodiment in different forms,there is shown in the drawings, and herein will be described in detail,specific embodiments of the invention. The present disclosure is to beconsidered an example of the principles of the invention, and is notintended to limit the invention to that which is illustrated anddescribed herein.

The invention provides a method 100 for pausing on a SCAN based test.The method 100 uses a unique technique to force the ATE to haltexecution of the SCAN pattern at any link in a scan chain for any numberof SCAN partitions. The method 100 includes a number of individualsteps, as illustrated in FIG. 1.

The method 100 preferably begins with step 102, which is to read theSCAN chain data for a SCAN partition.

Step 104 of the method 100 is to save the original SCAN chain data.

Step 106 of the method 100 is to rewrite the SCAN chain data with awalking or standing strobe character, such as an “L”, at the link in thechain where the pause is desired. For example, if the original SCANchain data had fifteen (15) links, and those links included thefollowing strobe characters: XXXXXLHHHLLHLHL, the links could berewritten for each execution of the parallel partition as displayed inTable 1.

TABLE 1 Link Link Link Link Link Link Link Link Link Link Link Link LinkLink Link 01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 Execution 01 SCANData: L X X X X X X X X X X X X X X Execution 02 SCAN Data: X L X X X XX X X X X X X X X Execution 03 SCAN Data: X X L X X X X X X X X X X X XExecution 04 SCAN Data: X X X L X X X X X X X X X X X Execution 05 SCANData: X X X X L X X X X X X X X X X Execution 06 SCAN Data: X X X X X LX X X X X X X X X Execution 07 SCAN Data: X X X X X X L X X X X X X X XExecution 08 SCAN Data: X X X X X X X L X X X X X X X Execution 09 SCANData: X X X X X X X X L X X X X X X Execution 10 SCAN Data: X X X X X XX X X L X X X X X Execution 11 SCAN Data: X X X X X X X X X X L X X X XExecution 12 SCAN Data: X X X X X X X X X X X L X X X Execution 13 SCANData: X X X X X X X X X X X X L X X Execution 14 SCAN Data: X X X X X XX X X X X X X L X Execution 15 SCAN Data: X X X X X X X X X X X X X X L

Step 108 of the method 100 is to set the compare level for output pinassociated with the walking or standing character so that a device undertest (DUT) failure results when the ATE executes the SCAN partition. Forexample, the compare level would be set to −1.0 volt, which will causethe output low “L” strobe to fail.

Step 110 of the method 100 is to mask all output pins except for theoutput pin with the walking or standing strobe character.

Step 112 of the method 100 is to execute the partition to failure. Thetest will thus be suspended or paused during the execution of thepartition at the link in the chain where the walking or standing stroberesides.

Step 114 of the method 100 is to perform any other tasks required duringthe paused condition.

Step 116 is to determine whether a pause is necessary on another link.If another pause is necessary, return to step 106 of the method 100 andagain follow steps 106, 108, 110, 112, 114 and 116. If another pause ifnot necessary, move forward to step 118 of the method 100. In otherwords, the method 100 can be used to stop on a specific link within achain as opposed to successive links within a chain. For example, if auser only wants to stop on link 10, as shown in TABLE 1, then the ATE'sSCAN memory would only be suspended or paused once with the informationshown in “Execution 10 SCAN Data”.

Step 118 is to rewrite the original SCAN chain characters back to theATE's SCAN memory, which was saved in step 104 of the method 100. Themethod 100 finishes with the completion of step 118. Thus, the originalSCAN pattern exists once the user is finished with the method 100.

A walking “H” or some other strobe character with the appropriatecompare level that would cause a failure may also be used to initiatethe pause condition. The characters preceding the walking strobecharacters, as shown in TABLE 1, are don't care “X” characters. Thesedon't care “X” characters prevent a failure from occurring prior to thewalking strobe character. The characters that follow the walking strobecharacters, an “X” as shown in TABLE 1, are of no consequence becausethe walking strobe character is what causes the failure and curtails thetest. The walking strobe character pauses the test at the desired linkin the chain.

Although a SCAN based pattern may include multiple chains, the method100 only requires that the walking strobe or standing strobe be placedon any one chain since all of the chains are executed simultaneously.The output pins on the other chains are masked in step 110 so that onlythe chain with the walking strobe causes the pause state for all chainsirrespective of their output strobe characters.

The method 100 thus provides the capability to pause on any link withina chain on any ATE that utilizes looping and SCAN memory. The method 100further provides the capability to pause on any link in a SCAN pattern,but it does not require any permanent changes to the SCAN pattern ortest program flow. Thus, the method 100 does not have any of thedisadvantages associated with the existing approaches, as described inthe Background section.

Also, although the method 100 is geared toward applications involvingserialized pattern vectors, it can be utilized in applications involvingparallel vector patterns as well. However, ATE's typically provide othermethods for pausing on parallel vectors.

Tables 2-4 provide an example use of a walling strobe to collect IDDdata while paused on the chain links of a SCAN based pattern. Table 2 isan actual data log of failures when using a walking “L” strobe characteron a SCAN based pattern with Partitions 40-41: Chains 0-255. Table 3 isan actual data log of a test program run using a walling “L” strobecharacter to collect IDD data while paused on the links of a chain in aSCAN based pattern with Partitions 40-41: Chains 0-255. Table 4 isactual IDD data that was collected by using a walking “L” strobecharacter to pause on the links of a chain in a SCAN based pattern withPartitions 40-41: Chains 0-255.

TABLE 2 script file ‘example_run.log’ is opened begin> data fct begin>pause test blkll begin>  STDF Version 4 has been enabled STDF collectionfile ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened. BLK_OS_FUN_CON  8 to342 pass BLK_OS_FUN_SRT  8 to 342 pass f res BLK_A_FUNC_MIN   360 to235519 pass BLK_B1_FUNC_MIN 235520 to 315127 pass BLK_B2_FUNC_MIN 315128to 490479 pass BLK_C1_FUNC_MIN 490480 to 660943 pass BLK_C3_FUNC_MIN660944 to 798527 pass BLK_C5_FUNC_MIN  798528 to 1042919 passBLK_C6_FUNC_MIN 1042920 to 1121375 pass BLK_C7_FUNC_MIN 1121376 to1191319 pass BLK_D1_FUNC_MIN 1191320 to 1207167 pass BLK_D2_FUNC_MIN1207168 to 1239743 pass BLK_D3_FUNC_MIN 1239744 to 1369391 passBLK_E1_FUNC_MIN 1369392 to 1704319 pass BLK_E2_FUNC_MIN 1704320 to2135047 pass BLK_E3_FUNC_MIN 2135048 to 2191079 pass BLK_E4_FUNC_MIN2191080 to 2349191 pass BLK_F1_FUNC_MIN 2349192 to 2401743 passBLK_F2_FUNC_MIN 2401744 to 2725007 pass BLK_H_FUNC_MIN 2725008 to2731743 pass BLK_Q_FUNC_MIN 2915464 to 2958815 pass BLK_G_FUNC_MIN2890472 to 2901951 pass Pause in “BLKL1” due to test nametest_name(name=“BLKL1”) break> pause fct break> BLK_L1_FAST_SCAN 2958816to 2960439 pass Pause in “BLK_L1_FAST_SCAN” due to functional passfunc_test(func_pins = OBPIN, start_vec = 2958816 , stop_vec = 2960439)break> data fail break> faq BLK_L1_FAST_SCAN 2959030 to 2959045 *FAIL*    LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = −Vector Loop Cycle FAILED DUT PIN 2959041 1 522 SC  40:0  Cnt3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045 *FAIL*     LOWFAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = − VectorLoop Cycle FAILED DUT PIN 2959041 2 523 SC  40:1  Cnt 3   .D249_TX_DIP23 BLK_L1_FAST_SCAN 2959030 to 2959045 *FAIL*     LOW FAIL = .     HIGHFAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = − Vector Loop Cycle FAILEDDUT PIN 2959041 3 524 SC  40:2  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN2959030 to 2959045 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATEFAIL = *  SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 4525 SC  40:3  Cnt 3   .D249_TX_DI P23 . . . . . BLK_L1_FAST_SCAN 2959030to 2959045 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = * SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 251 772SC  40:250  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 252 773SC  40:251  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 253 774SC  40:252  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 254 775SC  40:253  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 255 776SC  40:254  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959030 to 2959045*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959041 256 777SC  40:255  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 1 522 SC  41:0  Cnt3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050 *FAIL*     LOWFAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = − VectorLoop Cycle FAILED DUT PIN 2959046 2 523 SC  41:1  Cnt 3   .D249_TX_DIP23 BLK_L1_FAST_SCAN 2959035 to 2959050 *FAIL*     LOW FAIL = .     HIGHFAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = − Vector Loop Cycle FAILEDDUT PIN 2959046 3 524 SC  41:2  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN2959035 to 2959050 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATEFAIL = *  SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 4525 SC  41:3  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to2959050 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = * SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 5 526SC  41:4  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 6 527 SC  41:5  Cnt3   .D249_TX_DI P23 . . . . . . . D249_TX_DI P23 BLK_L1_FAST_SCAN2959035 to 2959050 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATEFAIL = *  SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 251772 SC  41:250  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to2959050 *FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = * SX:NO COMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 252 773SC  41:251  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 253 774SC  41:252  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 254 775SC  41:253  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 255 776SC  41:254  Cnt 3   .D249_TX_DI P23 BLK_L1_FAST_SCAN 2959035 to 2959050*FAIL*     LOW FAIL = .     HIGH FAIL = /  TRISTATE FAIL = *  SX:NOCOMPARE = − Vector Loop Cycle FAILED DUT PIN 2959046 256 777SC  41:255  Cnt 3   .D249_TX_DI P23 break> quit scansignolog2.txt Enter{circumflex over ( )}A <advance> to start {circumflex over ( )}F<finish> to stop {circumflex over ( )}P to pause begin> data fct begin>pause test blkl1 begin>  STDF Version 4 has been enabled STDF collectionfile ‘/home3/STDF/coll_UNSPECIFIED.std’ is opened. BLK_OS_FUN_CON  8 to342 pass BLK_OS_FUN_SRT  8 to 342 pass BLK_A_FUNC_MIN   360 to 235519pass BLK_B1_FUNC_MIN 235520 to 315127 pass BLK_B2_FUNC_MIN 315128 to490479 pass BLK_C1_FUNC_MIN 490480 to 660943 pass BLK_C3_FUNC_MIN 660944to 798527 pass BLK_C5_FUNC_MIN  798528 to 1042919 pass BLK_C6_FUNC_MIN1042920 to 1121375 pass BLK_C7_FUNC_MIN 1121376 to 1191319 passBLK_D1_FUNC_MIN 1191320 to 1207167 pass BLK_D2_FUNC_MIN 1207168 to1239743 pass BLK_D3_FUNC_MIN 1239744 to 1369391 pass BLK_E1_FUNC_MIN1369392 to 1704319 pass BLK_E2_FUNC_MIN 1704320 to 2135047 passBLK_E3_FUNC_MIN 2135048 to 2191079 pass BLK_E4_FUNC_MIN 2191080 to2349191 pass BLK_F1_FUNC_MIN 2349192 to 2401743 pass BLK_F2_FUNC_MIN2401744 to 2725007 pass BLK_H_FUNC_MIN 2725008 to 2731743 passBLK_Q_FUNC_MIN 2915464 to 2958815 pass BLK_G_FUNC_MIN 2890472 to 2901951pass Pause in “BLKL1” due to test name test_name(name=“BLKL1”) break>pause fct break> Pause in “BLK_L1_FAST_SCAN” due to functional passfunc_test(func_pins = OBPIN, start_vec = 2958816 , stop_vec = 2960439)break> data off break> faq For options 1, 2, and 4 you must already bepaused on the pattern of interest For option 3 you must be paused on thefunctional continuity test. If you are not paused as required, chooseoption 5 to exit this menu to get to the required pause location. Inaddition, options 1 and 3 use a user defined pinlist RMA that isinitially set to ALLPIN. You can update the RMA pinlist by using theinteractive pinl command prior to using options 1 and 3 of this routine.Note: In many menus if you enter a −1 it will return you to the testprogram flow. Enter a 1 for ATESignature functional pattern analysis.Enter a 2 for ATEPattern changing analysis. Enter a 3 for ATECurvetracing analysis. Enter a 4 for ATESignature scan pattern analysis.Enter a 5 to return to the program. Enter your selection: 4  Enter thepattern start address: 2958816 PLEASE NOTE: If the analysis is abortedprematurely (ex. cntl C) the scan pattern will likely be corrupted. Ifyou log scan failures the run time will increase. Scan patterns strobeinformation that was clocked in in the previous partition. For example:if the scan pattern is failing partition 12, you need to includepartition 11 in the analysis because the input data on partition 11 iswhat is causing the the output failures on partition 12. Scan patternsstrobe information that was clocked in in the previous partition. Forexample: if the scan pattern is failing partition 12, you need toinclude partition 11 in the analysis because the input data on partition11 is what is causing the the output failures on partition 12.  Enterthe first partition number for analysis: 40  Enter the last partitionnumber for analysis: 41 You may choose to use one power setting duringthe pattern execution and another at the stop location when the iddmeasurement is taken. Of course you can use the same setting for both.PS 1 is currently set to 2.500 Enter value to use during the patternexecution: 2.5 Enter value to use the during idd measurement: 2.5 Storethe idd current for this supply [0=no, 1=yes]: 1 PS 2 is currently setto 2.500 Enter value to use during the pattern execution: 2.5 Entervalue to use the during idd measurement: 2.65 Store the idd current forthis supply [0=no, 1=yes]: 1 PS 3 is currently set to 5.001 Enter valueto use during the pattern execution: 5 Enter value to use the during iddmeasurement: 5 Store the idd current for this supply [0=no, 1=yes]: 0 PS4 is currently set to 4.994 Enter value to use during the patternexecution: 5 Enter value to use the during idd measurement: 5 Store theidd current for this supply [0=no, 1=yes]: 0 PS 5 is currently set to2.502 Enter value to use during the pattern execution: 2.5 Enter valueto use the during idd measurement: 2.65 Store the idd current for thissupply [0=no, 1=yes]: 1 PS 6 is currently set to 1.502 Enter value touse during the pattern execution: 1.5 Enter value to use the during iddmeasurement: 1.5 Store the idd current for this supply [0=no, 1=yes]: 0PS 7 is currently set to 0.752 Enter value to use during the patternexecution: .75 Enter value to use the during idd measurement: .75 Storethe idd current for this supply [0=no, 1=yes]: 0  MI = Measure Idd Flag CV = Current Voltage Setting  RV = Pattern Run Voltage  RV = MV =Voltage During Idd Measurement  Your power selections are: PS 1: MI = 1,CV = 2.500 RV = 2.500 MV = 2.500 PS 2: MI = 1, CV = 2.500 RV = 2.500 MV= 2.650 PS 3: MI = 0, CV = 5.001 RV = 5.000 MV = 5.000 PS 4: MI = 0, CV= 4.994 RV = 5.000 MV = 5.000 PS 5: MI = 1, CV = 2.502 RV = 2.500 MV =2.650 PS 6: MI = 0, CV = 1.502 RV = 1.500 MV = 1.500 PS 7: MI = 0, CV =0.752 RV = 0.750 MV = 0.750  Are these power settings correct [0 = no, 1= yes:]1 Typically you will float any pins with an X, L, or H patternvector character when measuring IDD. Enter a 1 to float X, L, and Hpins. Enter a 2 to keep them connected to the pin electronics. Enteryour selection: 1 Do not make the file name the same as the programname.Enter the file name for saving the output: examplerun.txt Enter thefile name for saving the output: examplerun.txt The file examplerun.txthas been opened. Number of scan pins = 2 Tester channel: 28 chainnumber: 0 pin type: SI index: 0 Tester channel: 22 chain number: 0 pintype: SO index: 1  Processing partition 40 of 41  ProcessingPartition:40   Link:0  Processing Partition:40   Link:1  ProcessingPartition:40   Link:2  Processing Partition:40   Link:3  ProcessingPartition:40   Link:4  Processing Partition:40   Link:5 . . . . . Processing Partition:40   Link:250  Processing Partition:40   Link:251 Processing Partition:40   Link:252  Processing Partition:40   Link:253 Processing Partition:40   Link:254  Processing Partition:40   Link:255 Processing partition 41 of 41  Processing Partition:41   Link:0 Processing Partition:41   Link:1  Processing Partition:41   Link:2 Processing Partition:41   Link:3  Processing Partition:41   Link:4 Processing Partition:41   Link:5 . . . . .  Processing Partition:41  Link:250  Processing Partition:41   Link:251  Processing Partition:41  Link:252  Processing Partition:41   Link:253  Processing Partition:41  Link:254  Processing Partition:41   Link:255  break>

TABLE 4 scansig_ex.txt Test Date: Sep 1 2004 Test Time: 10:23:46 Theprogram name is: ./cima_scandev This test is: BLK_L1_FAST_SCAN Tester:QRT8 RPS = PS Voltage During Pattern Run MPS = PS Voltage DuringMeasurement RPS 1 = 2.50 MPS 1 = 2.50 RPS 2 = 2.50 MPS 2 = 2.65 RPS 3 =5.00 MPS 3 = 5.00 RPS 4 = 5.00 MPS 4 = 5.00 RPS 5 = 2.50 MPS 5 = 2.65RPS 6 = 1.50 MPS 6 = 1.50 RPS 7 = 0.75 MPS 7 = 0.75 RPS05 = 2.50 Parti-RPS01 = 2.50 RPS02 = 2.50 MPS05 = tion Link Vector MPS01 = 2.50 MPS02 =2.65 2.65 40 0 2959041 0.000027 0.000042 0.002514 40 1 2959041 0.0000310.000041 0.002545 40 2 2959041 0.000030 0.000043 0.002607 40 3 29590410.000029 0.000040 0.002545 40 4 2959041 0.000028 0.000041 0.002545 40 52959041 0.000027 0.000040 0.002576 40 6 2959041 0.000030 0.0000420.002482 40 7 2959041 0.000028 0.000041 0.002576 40 8 2959041 0.0000270.000040 0.002545 40 9 2959041 0.000026 0.000040 0.002545 40 10 29590410.000025 0.000041 0.002576 40 11 2959041 0.000024 0.000038 0.002576 4012 2959041 0.000029 0.000042 0.002545 40 13 2959041 0.000033 0.0000410.002576 40 14 2959041 0.000027 0.000038 0.002545 40 15 2959041 0.0000280.000044 0.002545 40 16 2959041 0.000027 0.000042 0.002545 40 17 29590410.000029 0.000041 0.002545 40 18 2959041 0.000030 0.000041 0.002545 4019 2959041 0.000027 0.000037 0.002545 40 20 2959041 0.000028 0.0000440.002545 40 21 2959041 0.000028 0.000042 0.002545 40 22 2959041 0.0000280.000041 0.002545 40 23 2959041 0.000031 0.000042 0.002482 40 24 29590410.000029 0.000041 0.002576 40 25 2959041 0.000028 0.000042 0.002576 4026 2959041 0.000029 0.000041 0.002576 40 27 2959041 0.000028 0.0000390.002545 40 28 2959041 0.000029 0.000040 0.002545 40 29 2959041 0.0000330.000041 0.002576 40 30 2959041 0.000029 0.000039 0.002545 40 31 29590410.000028 0.000043 0.002545 40 32 2959041 0.000031 0.000042 0.002545 4033 2959041 0.000025 0.000041 0.002607 40 34 2959041 0.000031 0.0000410.002545 40 35 2959041 0.000032 0.000041 0.002576 40 36 2959041 0.0000280.000038 0.002576 40 37 2959041 0.000029 0.000037 0.002576 40 38 29590410.000027 0.000041 0.002576 40 39 2959041 0.000028 0.000043 0.002514 4040 2959041 0.000029 0.000040 0.002576 40 41 2959041 0.000030 0.0000450.002545 40 42 2959041 0.000032 0.000042 0.002451 40 43 2959041 0.0000300.000045 0.002545 40 44 2959041 0.000027 0.000040 0.002576 40 45 29590410.000023 0.000038 0.002514 40 46 2959041 0.000027 0.000041 0.002545 4047 2959041 0.000031 0.000042 0.002545 40 48 2959041 0.000033 0.0000420.002607 40 49 2959041 0.000028 0.000041 0.002545 40 50 2959041 0.0000300.000041 0.002545 40 51 2959041 0.000030 0.000042 0.002514 40 52 29590410.000029 0.000041 0.002545 40 53 2959041 0.000027 0.000042 0.002545 4054 2959041 0.000029 0.000040 0.002545 40 55 2959041 0.000030 0.0000390.002576 40 56 2959041 0.000029 0.000043 0.002576 40 57 2959041 0.0000280.000040 0.002576 40 58 2959041 0.000029 0.000041 0.002545 40 59 29590410.000028 0.000042 0.002576 40 60 2959041 0.000027 0.000043 0.002576 4061 2959041 0.000030 0.000041 0.002576 40 62 2959041 0.000031 0.0000420.002576 40 63 2959041 0.000029 0.000042 0.002576 40 64 2959041 0.0000290.000041 0.002545 40 65 2959041 0.000030 0.000043 0.002545 40 66 29590410.000029 0.000037 0.002576 40 67 2959041 0.000029 0.000040 0.002545 4068 2959041 0.000029 0.000040 0.002576 40 69 2959041 0.000031 0.0000400.002576 40 70 2959041 0.000029 0.000042 0.002545 40 71 2959041 0.0000300.000042 0.002545 40 72 2959041 0.000030 0.000041 0.002545 40 73 29590410.000029 0.000041 0.002576 40 74 2959041 0.000028 0.000042 0.002576 4075 2959041 0.000028 0.000039 0.002545 40 76 2959041 0.000030 0.0000400.002607 40 77 2959041 0.000025 0.000041 0.002607 40 78 2959041 0.0000260.000036 0.002545 40 79 2959041 0.000025 0.000042 0.002576 40 80 29590410.000032 0.000040 0.002576 40 81 2959041 0.000029 0.000040 0.002576 4082 2959041 0.000028 0.000042 0.002607 40 83 2959041 0.000029 0.0000410.002545 40 84 2959041 0.000029 0.000042 0.002576 40 85 2959041 0.0000280.000041 0.002545 40 86 2959041 0.000030 0.000041 0.002576 40 87 29590410.000033 0.000042 0.002576 40 88 2959041 0.000028 0.000039 0.002576 4089 2959041 0.000029 0.000040 0.002576 40 90 2959041 0.000031 0.0000410.002545 40 91 2959041 0.000027 0.000042 0.002576 40 92 2959041 0.0000270.000039 0.002576 40 93 2959041 0.000027 0.000039 0.002514 40 94 29590410.000026 0.000038 0.002545 40 95 2959041 0.000030 0.000041 0.002638 4096 2959041 0.000030 0.000043 0.002576 40 97 2959041 0.000032 0.0000420.002482 40 98 2959041 0.000029 0.000040 0.002482 40 99 2959041 0.0000270.000040 0.002576 40 100 2959041 0.000030 0.000040 0.002545 40 1012959041 0.000028 0.000042 0.002545 40 102 2959041 0.000027 0.0000420.002576 40 103 2959041 0.000027 0.000039 0.002576 40 104 29590410.000029 0.000039 0.002545 40 105 2959041 0.000030 0.000040 0.002576 40106 2959041 0.000028 0.000042 0.002514 40 107 2959041 0.000028 0.0000410.002576 40 108 2959041 0.000028 0.000041 0.002545 40 109 29590410.000024 0.000038 0.002545 40 110 2959041 0.000029 0.000038 0.002576 40111 2959041 0.000031 0.000042 0.002576 40 112 2959041 0.000030 0.0000400.002576 40 113 2959041 0.000030 0.000042 0.002576 40 114 29590410.000029 0.000037 0.002545 40 115 2959041 0.000029 0.000042 0.002576 40116 2959041 0.000030 0.000040 0.002545 40 117 2959041 0.000028 0.0000400.002545 40 118 2959041 0.000026 0.000038 0.002576 40 119 29590410.000027 0.000042 0.002576 40 120 2959041 0.000026 0.000042 0.002576 40121 2959041 0.000028 0.000041 0.002514 40 122 2959041 0.000026 0.0000420.002545 40 123 2959041 0.000029 0.000042 0.002576 40 124 29590410.000028 0.000040 0.002576 40 125 2959041 0.000029 0.000043 0.002576 40126 2959041 0.000030 0.000045 0.002576 40 127 2959041 0.000028 0.0000410.002545 40 128 2959041 0.000031 0.000038 0.002545 40 129 29590410.000030 0.000041 0.002576 40 130 2959041 0.000030 0.000042 0.002576 40131 2959041 0.000030 0.000041 0.002545 40 132 2959041 0.000027 0.0000400.002576 40 133 2959041 0.000030 0.000039 0.002576 40 134 29590410.000028 0.000040 0.002514 40 135 2959041 0.000028 0.000041 0.002482 40136 2959041 0.000033 0.000040 0.002514 40 137 2959041 0.000028 0.0000430.002576 40 138 2959041 0.000028 0.000042 0.002514 40 139 29590410.000028 0.000039 0.002576 40 140 2959041 0.000023 0.000041 0.002638 40141 2959041 0.000030 0.000042 0.002545 40 142 2959041 0.000027 0.0000420.002576 40 143 2959041 0.000027 0.000042 0.002576 40 144 29590410.000032 0.000042 0.002514 40 145 2959041 0.000029 0.000040 0.002576 40146 2959041 0.000029 0.000041 0.002576 40 147 2959041 0.000031 0.0000430.002514 40 148 2959041 0.000021 0.000041 0.002514 40 149 29590410.000029 0.000040 0.002576 40 150 2959041 0.000029 0.000042 0.002576 40151 2959041 0.000029 0.000040 0.002576 40 152 2959041 0.000029 0.0000420.002576 40 153 2959041 0.000027 0.000043 0.002607 40 154 29590410.000029 0.000040 0.002576 40 155 2959041 0.000028 0.000040 0.002576 40156 2959041 0.000031 0.000043 0.002607 40 157 2959041 0.000028 0.0000400.002545 40 158 2959041 0.000029 0.000042 0.002576 40 159 29590410.000029 0.000043 0.002576 40 160 2959041 0.000030 0.000039 0.002545 40161 2959041 0.000026 0.000042 0.002576 40 162 2959041 0.000032 0.0000420.002545 40 163 2959041 0.000029 0.000042 0.002607 40 164 29590410.000032 0.000041 0.002514 40 165 2959041 0.000026 0.000038 0.002576 40166 2959041 0.000029 0.000042 0.002545 40 167 2959041 0.000029 0.0000410.002607 40 168 2959041 0.000028 0.000041 0.002545 40 169 29590410.000027 0.000041 0.002545 40 170 2959041 0.000030 0.000039 0.002576 40171 2959041 0.000028 0.000039 0.002576 40 172 2959041 0.000028 0.0000420.002576 40 173 2959041 0.000033 0.000042 0.002607 40 174 29590410.000029 0.000041 0.002545 40 175 2959041 0.000030 0.000045 0.002545 40176 2959041 0.000030 0.000041 0.002545 40 177 2959041 0.000029 0.0000400.002576 40 178 2959041 0.000027 0.000038 0.002607 40 179 29590410.000027 0.000038 0.002545 40 180 2959041 0.000030 0.000045 0.002545 40181 2959041 0.000025 0.000041 0.002545 40 182 2959041 0.000024 0.0000390.002451 40 183 2959041 0.000028 0.000041 0.002545 40 184 29590410.000027 0.000041 0.002545 40 185 2959041 0.000028 0.000040 0.002576 40186 2959041 0.000028 0.000042 0.002576 40 187 2959041 0.000027 0.0000360.002514 40 188 2959041 0.000027 0.000042 0.002576 40 189 29590410.000028 0.000041 0.002545 40 190 2959041 0.000031 0.000040 0.002576 40191 2959041 0.000029 0.000040 0.002576 40 192 2959041 0.000026 0.0000410.002545 40 193 2959041 0.000029 0.000040 0.002576 40 194 29590410.000027 0.000038 0.002576 40 195 2959041 0.000031 0.000042 0.002576 40196 2959041 0.000027 0.000040 0.002576 40 197 2959041 0.000031 0.0000400.002545 40 198 2959041 0.000029 0.000037 0.002545 40 199 29590410.000027 0.000040 0.002576 40 200 2959041 0.000027 0.000040 0.002514 40201 2959041 0.000027 0.000041 0.002607 40 202 2959041 0.000030 0.0000370.002576 40 203 2959041 0.000031 0.000040 0.002576 40 204 29590410.000028 0.000040 0.002545 40 205 2959041 0.000027 0.000042 0.002576 40206 2959041 0.000028 0.000040 0.002545 40 207 2959041 0.000028 0.0000420.002576 40 208 2959041 0.000029 0.000042 0.002576 40 209 29590410.000029 0.000039 0.002545 40 210 2959041 0.000027 0.000040 0.002545 40211 2959041 0.000027 0.000040 0.002545 40 212 2959041 0.000032 0.0000420.002545 40 213 2959041 0.000029 0.000040 0.002576 40 214 29590410.000027 0.000041 0.002545 40 215 2959041 0.000029 0.000040 0.002576 40216 2959041 0.000030 0.000045 0.002545 40 217 2959041 0.000033 0.0000410.002576 40 218 2959041 0.000030 0.000043 0.002638 40 219 29590410.000025 0.000046 0.002545 40 220 2959041 0.000028 0.000042 0.002576 40221 2959041 0.000030 0.000043 0.002545 40 222 2959041 0.000033 0.0000420.002607 40 223 2959041 0.000031 0.000042 0.002482 40 224 29590410.000027 0.000040 0.002545 40 225 2959041 0.000031 0.000042 0.002545 40226 2959041 0.000028 0.000040 0.002576 40 227 2959041 0.000028 0.0000410.002576 40 228 2959041 0.000027 0.000041 0.002545 40 229 29590410.000030 0.000039 0.002545 40 230 2959041 0.000030 0.000044 0.002545 40231 2959041 0.000028 0.000041 0.002576 40 232 2959041 0.000033 0.0000380.002545 40 233 2959041 0.000025 0.000040 0.002545 40 234 29590410.000027 0.000037 0.002576 40 235 2959041 0.000030 0.000041 0.002576 40236 2959041 0.000027 0.000042 0.002514 40 237 2959041 0.000027 0.0000390.002545 40 238 2959041 0.000030 0.000043 0.002638 40 239 29590410.000026 0.000038 0.002545 40 240 2959041 0.000028 0.000041 0.002545 40241 2959041 0.000030 0.000040 0.002545 40 242 2959041 0.000028 0.0000400.002545 40 243 2959041 0.000028 0.000042 0.002545 40 244 29590410.000027 0.000041 0.002576 40 245 2959041 0.000032 0.000040 0.002576 40246 2959041 0.000028 0.000042 0.002545 40 247 2959041 0.000028 0.0000420.002576 40 248 2959041 0.000028 0.000041 0.002545 40 249 29590410.000028 0.000040 0.002514 40 250 2959041 0.000027 0.000041 0.002576 40251 2959041 0.000027 0.000040 0.002545 40 252 2959041 0.000028 0.0000410.002545 40 253 2959041 0.000026 0.000040 0.003945 40 254 29590410.000028 0.000039 0.004039 40 255 2959041 0.000025 0.000042 0.003977 410 2959046 0.000031 0.000041 0.003977 41 1 2959046 0.000027 0.0000420.003977 41 2 2959046 0.000029 0.000039 0.003977 41 3 2959046 0.0000290.000042 0.003945 41 4 2959046 0.000028 0.000040 0.003945 41 5 29590460.000026 0.000041 0.003977 41 6 2959046 0.000026 0.000043 0.003977 41 72959046 0.000027 0.000039 0.003977 41 8 2959046 0.000027 0.0000430.003977 41 9 2959046 0.000032 0.000042 0.003945 41 10 2959046 0.0000260.000039 0.003977 41 11 2959046 0.000029 0.000042 0.003977 41 12 29590460.000031 0.000040 0.004008 41 13 2959046 0.000028 0.000041 0.003977 4114 2959046 0.000028 0.000039 0.003977 41 15 2959046 0.000027 0.0000400.003977 41 16 2959046 0.000030 0.000041 0.003977 41 17 2959046 0.0000290.000038 0.003977 41 18 2959046 0.000025 0.000041 0.003977 41 19 29590460.000031 0.000042 0.004008 41 20 2959046 0.000027 0.000039 0.003977 4121 2959046 0.000031 0.000040 0.003977 41 22 2959046 0.000030 0.0000390.003914 41 23 2959046 0.000026 0.000037 0.003977 41 24 2959046 0.0000280.000040 0.004008 41 25 2959046 0.000029 0.000042 0.003977 41 26 29590460.000031 0.000038 0.003977 41 27 2959046 0.000028 0.000041 0.003977 4128 2959046 0.000029 0.000042 0.004008 41 29 2959046 0.000028 0.0000380.003977 41 30 2959046 0.000027 0.000042 0.004008 41 31 2959046 0.0000270.000042 0.003977 41 32 2959046 0.000029 0.000043 0.003977 41 33 29590460.000028 0.000042 0.003977 41 34 2959046 0.000026 0.000043 0.003977 4135 2959046 0.000029 0.000042 0.003945 41 36 2959046 0.000031 0.0000410.003945 41 37 2959046 0.000027 0.000040 0.003945 41 38 2959046 0.0000280.000041 0.003977 41 39 2959046 0.000030 0.000041 0.003914 41 40 29590460.000031 0.000041 0.003914 41 41 2959046 0.000026 0.000040 0.004039 4142 2959046 0.000028 0.000041 0.003977 41 43 2959046 0.000031 0.0000400.003977 41 44 2959046 0.000025 0.000042 0.003977 41 45 2959046 0.0000260.000040 0.004008 41 46 2959046 0.000028 0.000040 0.004008 41 47 29590460.000029 0.000042 0.004008 41 48 2959046 0.000029 0.000042 0.003945 4149 2959046 0.000028 0.000041 0.003977 41 50 2959046 0.000027 0.0000400.003977 41 51 2959046 0.000027 0.000041 0.003945 41 52 2959046 0.0000290.000041 0.003914 41 53 2959046 0.000028 0.000042 0.003977 41 54 29590460.000029 0.000040 0.003977 41 55 2959046 0.000027 0.000040 0.004039 4156 2959046 0.000029 0.000044 0.003945 41 57 2959046 0.000029 0.0000400.003977 41 58 2959046 0.000030 0.000039 0.003945 41 59 2959046 0.0000290.000041 0.003977 41 60 2959046 0.000029 0.000044 0.003977 41 61 29590460.000031 0.000042 0.003977 41 62 2959046 0.000027 0.000042 0.004008 4163 2959046 0.000027 0.000039 0.003977 41 64 2959046 0.000032 0.0000380.004039 41 65 2959046 0.000028 0.000038 0.004039 41 66 2959046 0.0000270.000039 0.003977 41 67 2959046 0.000026 0.000041 0.003977 41 68 29590460.000031 0.000044 0.003977 41 69 2959046 0.000029 0.000040 0.003977 4170 2959046 0.000028 0.000042 0.003945 41 71 2959046 0.000027 0.0000440.004008 41 72 2959046 0.000027 0.000046 0.003977 41 73 2959046 0.0000280.000039 0.003977 41 74 2959046 0.000028 0.000041 0.003945 41 75 29590460.000027 0.000039 0.004008 41 76 2959046 0.000030 0.000039 0.003977 4177 2959046 0.000030 0.000037 0.003977 41 78 2959046 0.000027 0.0000400.003977 41 79 2959046 0.000027 0.000041 0.003945 41 80 2959046 0.0000240.000042 0.003977 41 81 2959046 0.000027 0.000042 0.003977 41 82 29590460.000028 0.000042 0.004008 41 83 2959046 0.000027 0.000039 0.003977 4184 2959046 0.000027 0.000042 0.003977 41 85 2959046 0.000027 0.0000410.003977 41 86 2959046 0.000030 0.000042 0.003977 41 87 2959046 0.0000290.000044 0.003945 41 88 2959046 0.000027 0.000041 0.003977 41 89 29590460.000030 0.000041 0.003977 41 90 2959046 0.000028 0.000041 0.003977 4191 2959046 0.000028 0.000038 0.004008 41 92 2959046 0.000030 0.0000400.003977 41 93 2959046 0.000027 0.000039 0.004008 41 94 2959046 0.0000280.000040 0.003977 41 95 2959046 0.000029 0.000042 0.004039 41 96 29590460.000025 0.000039 0.003977 41 97 2959046 0.000030 0.000041 0.003945 4198 2959046 0.000027 0.000040 0.004039 41 99 2959046 0.000028 0.0000420.003977 41 100 2959046 0.000028 0.000041 0.003977 41 101 29590460.000027 0.000041 0.003977 41 102 2959046 0.000029 0.000043 0.003977 41103 2959046 0.000028 0.000041 0.003945 41 104 2959046 0.000028 0.0000420.003977 41 105 2959046 0.000027 0.000044 0.003945 41 106 29590460.000027 0.000040 0.003945 41 107 2959046 0.000029 0.000038 0.003977 41108 2959046 0.000030 0.000040 0.003945 41 109 2959046 0.000027 0.0000410.004008 41 110 2959046 0.000029 0.000040 0.003977 41 111 29590460.000028 0.000042 0.004008 41 112 2959046 0.000029 0.000040 0.003977 41113 2959046 0.000030 0.000043 0.003977 41 114 2959046 0.000029 0.0000410.003977 41 115 2959046 0.000029 0.000040 0.003977 41 116 29590460.000027 0.000041 0.003977 41 117 2959046 0.000026 0.000040 0.003977 41118 2959046 0.000028 0.000040 0.003977 41 119 2959046 0.000029 0.0000390.003977 41 120 2959046 0.000027 0.000041 0.003977 41 121 29590460.000030 0.000042 0.003977 41 122 2959046 0.000030 0.000042 0.003977 41123 2959046 0.000032 0.000042 0.004008 41 124 2959046 0.000032 0.0000410.003977 41 125 2959046 0.000031 0.000043 0.004039 41 126 29590460.000031 0.000040 0.003977 41 127 2959046 0.000027 0.000042 0.003977 41128 2959046 0.000029 0.000040 0.003977 41 129 2959046 0.000027 0.0000400.003945 41 130 2959046 0.000027 0.000041 0.003977 41 131 29590460.000027 0.000041 0.004008 41 132 2959046 0.000029 0.000042 0.003977 41133 2959046 0.000031 0.000037 0.004008 41 134 2959046 0.000031 0.0000390.003977 41 135 2959046 0.000025 0.000041 0.003945 41 136 29590460.000028 0.000039 0.003977 41 137 2959046 0.000029 0.000042 0.003945 41138 2959046 0.000026 0.000040 0.003945 41 139 2959046 0.000029 0.0000420.004008 41 140 2959046 0.000027 0.000042 0.003977 41 141 29590460.000027 0.000038 0.003977 41 142 2959046 0.000031 0.000039 0.003977 41143 2959046 0.000028 0.000045 0.004008 41 144 2959046 0.000028 0.0000410.003977 41 145 2959046 0.000029 0.000041 0.003977 41 146 29590460.000028 0.000045 0.003977 41 147 2959046 0.000031 0.000041 0.003977 41148 2959046 0.000029 0.000041 0.003945 41 149 2959046 0.000029 0.0000400.004008 41 150 2959046 0.000029 0.000039 0.003945 41 151 29590460.000025 0.000041 0.003945 41 152 2959046 0.000031 0.000044 0.003977 41153 2959046 0.000027 0.000040 0.003945 41 154 2959046 0.000029 0.0000410.003945 41 155 2959046 0.000029 0.000038 0.003914 41 156 29590460.000029 0.000042 0.004008 41 157 2959046 0.000027 0.000037 0.003977 41158 2959046 0.000027 0.000039 0.003977 41 159 2959046 0.000028 0.0000370.003977 41 160 2959046 0.000030 0.000042 0.003977 41 161 29590460.000033 0.000040 0.003977 41 162 2959046 0.000028 0.000041 0.003977 41163 2959046 0.000029 0.000042 0.003977 41 164 2959046 0.000027 0.0000400.003977 41 165 2959046 0.000025 0.000040 0.003945 41 166 29590460.000029 0.000041 0.003977 41 167 2959046 0.000026 0.000041 0.003977 41168 2959046 0.000030 0.000041 0.003914 41 169 2959046 0.000027 0.0000410.003945 41 170 2959046 0.000028 0.000042 0.003977 41 171 29590460.000028 0.000040 0.003977 41 172 2959046 0.000031 0.000038 0.003977 41173 2959046 0.000027 0.000040 0.004039 41 174 2959046 0.000026 0.0000380.003977 41 175 2959046 0.000028 0.000040 0.004008 41 176 29590460.000028 0.000041 0.003977 41 177 2959046 0.000032 0.000040 0.003977 41178 2959046 0.000028 0.000042 0.004008 41 179 2959046 0.000029 0.0000420.003977 41 180 2959046 0.000029 0.000042 0.003977 41 181 29590460.000028 0.000040 0.003945 41 182 2959046 0.000030 0.000040 0.003977 41183 2959046 0.000028 0.000040 0.003977 41 184 2959046 0.000023 0.0000410.003914 41 185 2959046 0.000033 0.000043 0.003914 41 186 29590460.000030 0.000041 0.003977 41 187 2959046 0.000027 0.000042 0.003914 41188 2959046 0.000027 0.000042 0.003977 41 189 2959046 0.000030 0.0000420.003977 41 190 2959046 0.000029 0.000042 0.004008 41 191 29590460.000028 0.000042 0.003977 41 192 2959046 0.000031 0.000041 0.003977 41193 2959046 0.000033 0.000042 0.003977 41 194 2959046 0.000028 0.0000410.003945 41 195 2959046 0.000026 0.000039 0.003977 41 196 29590460.000031 0.000040 0.003977 41 197 2959046 0.000030 0.000042 0.003977 41198 2959046 0.000030 0.000039 0.003977 41 199 2959046 0.000029 0.0000400.003977 41 200 2959046 0.000031 0.000040 0.003977 41 201 29590460.000032 0.000040 0.004008 41 202 2959046 0.000027 0.000040 0.003977 41203 2959046 0.000026 0.000040 0.003977 41 204 2959046 0.000030 0.0000400.003977 41 205 2959046 0.000032 0.000041 0.004008 41 206 29590460.000026 0.000039 0.003977 41 207 2959046 0.000031 0.000040 0.003977 41208 2959046 0.000031 0.000040 0.003977 41 209 2959046 0.000027 0.0000410.003977 41 210 2959046 0.000031 0.000041 0.003945 41 211 29590460.000032 0.000040 0.003914 41 212 2959046 0.000030 0.000042 0.003914 41213 2959046 0.000028 0.000038 0.003977 41 214 2959046 0.000029 0.0000430.003977 41 215 2959046 0.000030 0.000040 0.003977 41 216 29590460.000029 0.000040 0.003883 41 217 2959046 0.000027 0.000041 0.003977 41218 2959046 0.000028 0.000040 0.003977 41 219 2959046 0.000030 0.0000420.003977 41 220 2959046 0.000029 0.000040 0.003977 41 221 29590460.000028 0.000040 0.004008 41 222 2959046 0.000027 0.000043 0.003945 41223 2959046 0.000029 0.000040 0.003977 41 224 2959046 0.000029 0.0000410.003977 41 225 2959046 0.000028 0.000034 0.003977 41 226 29590460.000029 0.000041 0.003977 41 227 2959046 0.000030 0.000042 0.003977 41228 2959046 0.000028 0.000043 0.003977 41 229 2959046 0.000028 0.0000400.004039 41 230 2959046 0.000025 0.000043 0.004039 41 231 29590460.000026 0.000045 0.003977 41 232 2959046 0.000027 0.000040 0.003977 41233 2959046 0.000028 0.000041 0.003945 41 234 2959046 0.000028 0.0000390.003977 41 235 2959046 0.000028 0.000044 0.004039 41 236 29590460.000026 0.000043 0.003977 41 237 2959046 0.000027 0.000040 0.004008 41238 2959046 0.000029 0.000038 0.003945 41 239 2959046 0.000033 0.0000420.003977 41 240 2959046 0.000029 0.000040 0.003977 41 241 29590460.000029 0.000041 0.003977 41 242 2959046 0.000030 0.000040 0.003945 41243 2959046 0.000026 0.000038 0.003945 41 244 2959046 0.000023 0.0000420.003945 41 245 2959046 0.000028 0.000039 0.003977 41 246 29590460.000028 0.000039 0.003977 41 247 2959046 0.000025 0.000042 0.003977 41248 2959046 0.000029 0.000041 0.003977 41 249 2959046 0.000027 0.0000390.003945 41 250 2959046 0.000030 0.000040 0.003977 41 251 29590460.000027 0.000042 0.003977 41 252 2959046 0.000029 0.000043 0.003977 41253 2959046 0.000031 0.000038 0.027105 41 254 2959046 0.000030 0.0000390.027167 41 255 2959046 0.000031 0.000040 0.027229

The invention provides a method 200 for using the stimulations andresponses of a known good device to increase the fault coverage of thepatterns in the test flow. The method 200 includes a number ofindividual steps, as illustrated in FIG. 2.

The method 200 preferably begins with step 202, which is to pause on thepattern of interest in the test program flow.

Step 204 of the method 200 is to provide an appropriate computerprogram.

Step 206 of the method 200 is to have the appropriate computer programquery the user regarding the start vector address.

Step 208 of the method 200 is to have the appropriate computer programquery the user regarding the first inspect vector address.

Step 210 of the method 200 is to have the appropriate computer programquery the user regarding the last inspect vector address, thus definingan inspect vector range between the first and last inspect vectoraddresses.

Step 212 of the method 200 is to have the appropriate computer programquery the user regarding consecutive passes for new vectors.

Step 214 of the method 200 is to have the appropriate computer programquery the user regarding data logging requirements.

Step 216 of the method 200 is to have the appropriate computer programquery the user regarding file name for output storage.

Step 218 of the method 200 is to have the appropriate computer programstart processing the pattern vectors in the inspect vector range. Theappropriate computer program characterizes each of the signals on thecurrent inspect vector with “X” or “don't care” characters to determinewhether an output signal is actually being driven. If the output signalis being driven, the appropriate computer program will change the “X” or“don't care” character to the appropriate high “H” or low “L” strobecharacter, depending on whether the signal is actually an output that isbeing driven to a high or low state. Once the appropriate computerprogram has completed changing an entire vector, it will run the patternwith the new vector for the consecutive passes required by the user.This will be done at both minimum and maximum normal operating voltage(VDD) device power settings to insure the new vector is not marginal.The “X” or “don't care” characters are typically signal outputcharacters that are not strobed and, therefore, they do not add to thefault coverage of the test.

Step 220 of the method 200 is to reset the new “H” or “L” strobecharacters back to their original “X” or “don't care” characters if anyof the new “H” or “L” strobe characters fail during consecutive passesat the minimum and maximum VDD power settings and then retesting. Step220 will continue until the new vector passes the required number ofconsecutive passes.

Step 222 of the method 200 is to process the next inspect vector byrepeating steps 218 and 220 as necessary. The method 200 will continueuntil all of the vectors in the inspect vector range have beenprocessed. The results will be saved to the file specified by the userand the pattern file containing the new vectors may be saved in theappropriate computer program for future use.

Thus, the method 200 uses the appropriate computer program to use thestimulations and responses of a know good device to increase the faultcoverage of the patterns in the test flow. The appropriate computerprogram does this by changing the patterns to include additional strobesin the pattern vectors that could not be determined during simulations.

The method 200 has a number of advantages, including, the fact that itresides within the test program and can be invoked easily and that itcan automatically characterize the outputs of a device to increase thefault coverage of the test program without the disadvantages ofre-design and re-simulation.

Table 5 provides an example run of the appropriate computer programusing the method 200.

TABLE 5 Enter {circumflex over ( )}A <advance> to start {circumflex over( )}F <finish> to stop {circumflex over ( )}P to pause begin> pause fctbegin> data fct begin>  STDF Version 4 has been enabled STDF collectionfile '/home3/STDF/coll_UNSFECIFIED.std' is opened. chmod:/home3/STDF/coll_UNSPECIFIED.std: Not owner BLK_B1_FUNC_MIN 235520 to315127 pass break> faq

 User is paused on the pattern of interest in invokes FAQuest Foroptions 1 and 2 you must already be paused on the pattern of interestFor option 3 you must be paused on the functional continuity test. Ifyou are not paused as required, choose option 4 to exit this menu to getto the required pause location. In addition, options 1 and 3 use a userdefined pinlist RMA that is initially set to ALLPIN. You can update theRMA pinlist by using the interactive pinl command prior to using options1 and 3 of this routine. Note: In many menus if you enter a −1 it willreturn you to the test program flow. Enter a 1 for ATESignature scananalysis. Enter a 2 for ATEPattern changing analysis. Enter a 3 forATECurve tracing analysis. Enter a 4 to return to the program. Enteryour selection: 2

 User select the ATEPattern changing analysis option.  Enter the patternstart address: 235520

 User input. You should make sure the first vector to inspect does notinclude the initialization vectors. An inspection of the pattern filewill usually show where the initialization vectors end. However a safeassumption is to skip the first 100 vectors of information. If you get afunctional burst fail after the change you likely need to skipadditional vectors.  Enter the first vector address to inspect: 235620

 User input.  Enter the last vector address to inspect: 235640

 User input. Consequtive passes required for new vectors (default 1): 2

 User input. Enter the number that corresponds to your data loggingrequirements of the vector anaylsis. Enter a 1 for no vector datalogging analysis. Enter a 2 for on screen data logging analysis. Enter a3 for open a file for data logging. Enter a 4 for both. Enter the datalogging switch option: 4

 User input. Do not make the file name the same as the program name.Enter a file name: example_run.txt

 User input. The file example run.txt has been opened. Skip Processingof a Non-Inspect Vector 235520 Skip Processing of a Non-Inspect Vector235521 Skip Processing of a Non-Inspect Vector 235522 Skip Processing ofa Non-Inspect Vector 235523 Skip Processing of a Non-Inspect Vector235524 Skip Processing of a Non-Inspect Vector 235525 Skip Processing ofa Non-Inspect Vector 235526 Skip Processing of a Non-Inspect Vector235527 Skip Processing of a Non-Inspect Vector 235528 Skip Processing ofa Non-Inspect Vector 235529 Skip Processing of a Non-Inspect Vector235530 Skip Processing of a Non-Inspect Vector 235531 Skip Processing ofa Non-Inspect Vector 235532 Skip Processing of a Non-Inspect Vector235533 Skip Processing of a Non-Inspect Vector 235534 Skip Processing ofa Non-Inspect Vector 235535 Skip Processing of a Non-Inspect Vector235536 Skip Processing of a Non-Inspect Vector 235537 Skip Processing ofa Non-Inspect Vector 235538 Skip Processing of a Non-Inspect Vector235539 Skip Processing of a Non-Inspect Vector 235540 Skip Processing ofa Non-Inspect Vector 235541 Skip Processing of a Non-Inspect Vector235542 Skip Processing of a Non-Inspect Vector 235543 Skip Processing ofa Non-Inspect Vector 235544 Skip Processing of a Non-Inspect Vector235545 Skip Processing of a Non-Inspect Vector 235546 Skip Processing ofa Non-Inspect Vector 235547 Skip Processing of a Non-Inspect Vector235548 Skip Processing of a Non-Inspect Vector 235549 Skip Processing ofa Non-Inspect Vector 235550 Skip Processing of a Non-Inspect Vector235551 Skip Processing of a Non-Inspect Vector 235552 Skip Processing ofa Non-Inspect Vector 235553 Skip Processing of a Non-Inspect Vector235554 Skip Processing of a Non-Inspect Vector 235555 Skip Processing ofa Non-Inspect Vector 235556 Skip Processing of a Non-Inspect Vector235557 Skip Processing of a Non-Inspect Vector 235558 Skip Processing ofa Non-Inspect Vector 235559 Skip Processing of a Non-Inspect Vector235560 Skip Processing of a Non-Inspect Vector 235561 Skip Processing ofa Non-Inspect Vector 235562 Skip Processing of a Non-Inspect Vector235563 Skip Processing of a Non-Inspect Vector 235564 Skip Processing ofa Non-Inspect Vector 235565 Skip Processing of a Non-Inspect Vector235566 Skip Processing of a Non-Inspect Vector 235567 Skip Processing ofa Non-Inspect Vector 235568 Skip Processing of a Non-Inspect Vector235569 Skip Processing of a Non-Inspect Vector 235570 Skip Processing ofa Non-Inspect Vector 235571 Skip Processing of a Non-Inspect Vector235572 Skip Processing of a Non-Inspect Vector 235573 Skip Processing ofa Non-Inspect Vector 235574 Skip Processing of a Non-Inspect Vector235575 Skip Processing of a Non-Inspect Vector 235576 Skip Processing ofa Non-Inspect Vector 235577 Skip Processing of a Non-Inspect Vector235578 Skip Processing of a Non-Inspect Vector 235579 Skip Processing ofa Non-Inspect Vector 235580 Skip Processing of a Non-Inspect Vector235581 Skip Processing of a Non-Inspect Vector 235582 Skip Processing ofa Non-Inspect Vector 235583 Skip Processing of a Non-Inspect Vector235584 Skip Processing of a Non-Inspect Vector 235585 Skip Processing ofa Non-Inspect Vector 235586 Skip Processing of a Non-Inspect Vector235587 Skip Processing of a Non-Inspect Vector 235588 Skip Processing ofa Non-Inspect Vector 235589 Skip Processing of a Non-Inspect Vector235590 Skip Processing of a Non-Inspect Vector 235591 Skip Processing ofa Non-Inspect Vector 235592 Skip Processing of a Non-Inspect Vector235593 Skip Processing of a Non-Inspect Vector 235594 Skip Processing ofa Non-Inspect Vector 235595 Skip Processing of a Non-Inspect Vector235596 Skip Processing of a Non-Inspect Vector 235597 Skip Processing ofa Non-Inspect Vector 235598 Skip Processing of a Non-Inspect Vector235599 Skip Processing of a Non-Inspect Vector 235600 Skip Processing ofa Non-Inspect Vector 235601 Skip Processing of a Non-Inspect Vector235602 Skip Processing of a Non-Inspect Vector 235603 Skip Processing ofa Non-Inspect Vector 235604 Skip Processing of a Non-Inspect Vector235605 Skip Processing of a Non-Inspect Vector 235606 Skip Processing ofa Non-Inspect Vector 235607 Skip Processing of a Non-Inspect Vector235608 Skip Processing of a Non-Inspect Vector 235609 Skip Processing ofa Non-Inspect Vector 235610 Skip Processing of a Non-Inspect Vector235611 Skip Processing of a Non-Inspect Vector 235612 Skip Processing ofa Non-Inspect Vector 235613 Skip Processing of a Non-Inspect Vector235614 Skip Processing of a Non-Inspect Vector 235615 Skip Processing ofa Non-Inspect Vector 235616 Skip Processing of a Non-Inspect Vector235617 Skip Processing of a Non-Inspect Vector 235618 Skip Processing ofa Non-Inspect Vector 235619 Processing Inspect Vector 235620 of 235640BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficm read = 0 Firststatus ficm read = 0 Changed an X to an H. First status ficm write = 0Xs changed to Ls = 0 Xs changed to Hs = 1 Power supplies set to minimum.Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set to maximumConsequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235621 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235622 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235623 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235624 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235625 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235626 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235627 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235628 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235629 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235630 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235631 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235632 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235633 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235634 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235635 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235636 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235637 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235638 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Processing Inspect Vector 235639 of 235640 BLK_B1_FUNC_MIN 235520 to235640 pass First status ficm read = 0 First status ficm read = 0Changed an X to an H. First status ficm write = 0 Xs changed to Ls = 0Xs changed to Hs = 1 Power supplies set to minimum. Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 Consequtive get_data_log result,the Ls and Hs have been written Result (Fail[70], Pass[80]) = 80, Vector= −1, Valid = 0 Power supplies set to maximum Consequtive get_data_logresult, the Ls and Hs have been written Result (Fail[70], Pass[80]) =80, Vector = −1, Valid = 0 Consequtive get_data_log result, the Ls andHs have been written Result (Fail[70], Pass[80]) = 80, Vector = −1,Valid = 0 These counts only relate to the pins included in your pinlist.Beginning Vector X Count = 75 Vector Xs changed to Ls = 0 Vector Xschanged to Hs = 1 Vector Xs unchanged = 74 Processing Inspect Vector235640 of 235640 BLK_B1_FUNC_MIN 235520 to 235640 pass First status ficmread = 0 First status ficm read = 0 Changed an X to an H. First statusficm write = 0 Xs changed to Ls = 0 Xs changed to Hs = 1 Power suppliesset to minimum. Consequtive get_data_log result, the Ls and Hs have beenwritten Result (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0Consequtive get_data_log result, the Ls and Hs have been written Result(Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Power supplies set tomaximum Consequtive get_data_log result, the Ls and Hs have been writtenResult (Fail[70], Pass[80]) = 80, Vector = −1, Valid = 0 Consequtiveget_data_log result, the Ls and Hs have been written Result (Fail[70],Pass[80]) = 80, Vector = −1, Valid = 0 These counts only relate to thepins included in your pinlist. Beginning Vector X Count = 75 Vector Xschanged to Ls = 0 Vector Xs changed to Hs = 1 Vector Xs unchanged = 74Pattern Summary Total Pattern Xs Considered = 1575 Total Pattern XsRemaining = 1554 Total Xs changed to Ls = 0 Total Xs changed to Hs = 21Total Xs changed break> = 21

The invention further provides a method 300 to curve trace devicebuffers on an ATE. The method 300 includes a number of individual steps,as illustrated in FIG. 3.

The method 300 begins with step 302, which is to define a predeterminedpin list. The predetermined pin list is set to include all of the pinsused during the pattern loads.

Step 304 of the method 300 is to modify the predetermined pin list usinga predetermined debugger command in order to include desired pins forcharacterization using an appropriate computer program.

Step 306 of the method 300 is to have the appropriate computer programquery the user regarding the filename where data will be stored.

Step 308 of the method 300 is to have the appropriate computer programquery the user as to whether the UNIX GNUPLOT utility will be used.

Step 310 of the method 300 is to read one of the pins from thepredetermined pin list.

Step 312 of the method 300 is to use pin measurement units to forceincrementally increasing voltage from zero (0) volts to a predefinedmaximum current limit is reached, for example, to a maximum of one (1)volt or until −100 μA of current limit is reached.

Step 314 of the method 300 is to flag any problem pins identified instep 312 and to store the values at each increment to the data files.

Step 316 of the method 300 is to use pin measurement units to forceincrementally decreasing voltage from zero (0) volts to a predefinedminimum current limit is reached, for example, to a minimum of negativeone (−1) volt or until +100 μA of current limit is reached.

Step 318 of the method 300 is to flag any problem pins identified instep 316 and to store the values at each increment to the data files.

Step 320 of the method 300 is to determine if all of the pins in thepredetermined pin list have been evaluated. If all of the pins in thepredetermined pin list have been evaluated, the method 300 is finished.If, however, all of the pins in the predetermined pin list have not beenevaluated, then the method 300 continues by returning to step 310 of themethod 300 and then executing steps 310, 312, 314, 316, 318, 320 asappropriate.

It should be noted that all test limits and increments are programmable.

The data can be stored in three different files, the names of which arespecified by the user, except where noted. The first file contains thepin name(s) and their associated data, such as voltage and current. Thefirst file is stored in a space separated text format readable byoffline analysis software, such as MathCAD or Microsoft EXCEL. Thesecond file contains the individual pin data that are used by thestandard UNIX 2D graphing utility “gnuplot”. These files areautomatically named with the pin name for the data it contains. Thethird file is a standard command file that the UNIX gnuplot utility canread to display the 2D graphs automatically.

Thus, the method 300 provides the user with the availability to curvetrace device buffers on an ATE. The method 300 has the advantage ofproviding buffer curve tracing and characterizing during an ATE testsession. The method 300 also has the advantage of not requiring the userto need to utilize offline curve tracing equipment. The method 300further has the advantage of allowing the user the ability to viewdigitized data and abnormalities not detected with go-no-go tests.

The method 300 could alternatively be used to collect data used in theanalysis of package development and the analysis of new fabricationtechnologies.

Step 312 of method 100 could alternatively use pin measurement units toforce or sink incremental currents and measure voltage to characterizethe device pins.

Tables 6-9 provide examples from using the method 300. Table 6 providesan example run of the appropriate computer program using the method 300.Table 7 provides an example of the files created by the method 300.Table 8 provides an example of the ability of the appropriate computerprogram to identify problems missed by a typical production testprogram.

TABLE 6 The following information was extracted from and actual testsection and shows how ATECurve is executed. begin> pause fct begin> STDF Version 4 has been enabled STDF collection file‘/home3/STDF/coll_UNSPECIFIED.std’ is opened. chmod:/home3/STDF/coll_UNSPECIFIED.std: Not owner Pause in “BLK_OS_FUN_CON”due to functional fail func_test(func_pins = ALLPIN, start_vec = 8 ,stop_vec = 290) This section of the test flow shows that the RMA pinlist is initially set to all pins used on the device. break> pinl rmaRMA : D279_SCSIR(1), D269_SCSII(2), D278_SCSIM(3), D266_SCSID(4),D270_SCSII(5), D276_SCSIS(6), D273_SCSIC(7), D275_SCSIS(8),D277_SCSIM(10), D288_SCSIA(11), D274_SCSIC(12), D280_SCSIR(13),D286_SCSIB(14), D285_SCSIB(16), D295_SCSID(17), D282_SCSIA(18),D296_SCSID(19), D281_SCSIA(20), D294_SCSID(21), D287_SCSIA(23),D291_SCSIP(24), D299_SCSID(25), D292_SCSIP(26), D300_SCSID(27),D293_SCSID(28), D301_SCSID(29), D297_SCSID(31), D298_SCSID(32),D308_SCSID(33), D302_SCSID(34), D307_SCSID(35), D303_SCSID(36),D309_SCSIP(37), D305_SCSID(38), D306_SCSID(39), D304_SCSID(40),D316_SCSID(41), D312_SCSID(42), D313_SCSID(43), D314_SCSID(44),D322_SCANM(45), D310_SCSIP(46), D319_TM(47), D311_SCSID(48),D317_SCSID(51), D326_PIPES(52), D328_TRACE(53), D315_SCSID(54),D325_PIPES(55), D323_TN(56), D001_TRACE(63), D076_TMSIC(65),D063_SCSIP(66), D073_IDDTN(67), D064_SCSIP(68), D067_SCSID(69),D062_SCSID(70), D066_SCSID(71), D065_SCSID(72), D142_PCIAD(89),D133_NPCIT(90), D145_PCIAD(91), D125_PCIAD(92), D136_NPCIP(93),D144_PCIAD(94), D140_PCIAD(95), D137_NPCIS(96), D216_GPIO_(97),D166_GPIO_(98), D226_NFLAS(99), D165_GPIO_(100), D214_GPIO_(102),D225_NFLAS(103), D215_GPIO_(104), D240_MAD_0(105), D234_MAD_5(106),D244_MAD_9(107), D230_NRAMW(108), D228_NRAMO(110), D237_MAD_3(112),D074_CLKMO(121), D068_SCSID(122), D070_SCSID(123), D069_SCSID(124),D072_SCSID(125), D075_TCKIC(126), D071_SCSID(127), D080_RTCKI(128),D155_PCIAD(129), D158_NPCIA(131), D139_NPCIC(132), D148_PCIAD(133),D152_PCIAD(134), D141_PCIAD(135), D138_PCIPA(136), D154_PCIAD(137),D147_PCIAD(138), D150_PCIAD(139), D146_PCIAD(140), D149_NPCIC(141),D153_PCIAD(143), D157_PCIAD(144), D175_NPCIC(145), D151_PCIAD(146),D156_PCIAD(148), D159_NPCIR(151), D178_PCIAD(153), D161_PCICL(154),D173_NPCIC(158), D179_PCIAD(159), D183_PCIAD(161), D167_CLKMO(162),D182_PCIAD(163), D172_NPCIC(164), D174_NPCIC(165), D176_PCIPA(166),D180_PCIAD(168), D190_PCIAD(169), D177_PCIAD(170), D186_PCIAD(171),D181_PCIAD(172), D187_PCIAD(173), D184_PCIAD(175), D191_PCIAD(176),D204_PCIAD(177), D185_PCIAD(178), D196_PCIAD(179), D192_PCIAD(180),D195_PCIAD(181), D189_PCIAD(182), D194_PCIAD(183), D193_PCIAD(184),D203_PCIAD(185), D198_PCIAD(186), D202_PCIAD(187), D201_PCIAD(188),D200_PCIAD(189), D197_PCIAD(190), D199_PCIAD(191), D205_PCIAD(192),D209_PCIAD(194), D208_PCIAD(196), D211_SPARE(198), D206_PCIAD(199),D212_SCANE(200), D207_PCIAD(202), D219_LED1(203), D222_GPIO_(205),D218_GPIO_(207), D221_SERIA(210), D223_GPIO_(213), D224_LED0(214),D220_SERIA(215), D229_NFLAS(220), D238_MAD_2(229), D232_MAD_7(231),D260_DIFFS(233), D255_NRAMA(235), D242_LEDHB(236), D251_MPAR_(237),D245_MAD_1(238), D248_MAD_1(239), D252_MPAR_(240), D263_SCSID(241),D257_SPARE(242), D256_NRAMC(243), D261_SCSID(244), D249_MAD_1(245),D262_SCSID(246), D254_NRAMA(247), D271_SCSIR(249), D265_SCSID(250),D272_SCSIR(251), D253_MCLK(252), D268_SCSID(253), D264_SCSID(255),D267_SCSID(256), D005_TRACE(257), D002_TRACE(259), D327_PIPES(260),D006_TRACE(261), D318_SCSID(262), D004_TRACE(263), D324_TRACE(264),D003_TRACE(265), D008_TRACE(267), D014_DIFFS(268), D012_SCSIC(269),D016_SCSID(271), D015_SCSID(272), D017_SCSID(274), D019_SCSID(275),D018_SCSID(276), D021_SCSID(277), D022_SCSID(279), D007_TRACE(280),D024_SCSII(281), D026_SCSIR(282), D027_SCSIC(283), D025_SCSIR(284),D028_SCSIC(285), D020_SCSID(286), D029_SCSIS(287), D023_SCSII(288),D036_SCSIA(289), D031_SCSIM(290), D041_SCSIA(291), D032_SCSIM(292),D033_SCSIR(293), D030_SCSIS(294), D034_SCSIR(295), D035_SCSIA(296),D045_SCSIP(297), D046_SCSIP(299), D038_SCSIB(300), D047_SCSID(301),D037_SCSIB(302), D040_SCSIA(304), D050_SCSID(305), D053_SCSID(307),D051_SCSID(308), D052_SCSID(309), D048_SCSID(310), D049_SCSID(312),D059_SCSID(313), D054_SCSID(314), D060_SCSID(315), D057_SCSID(316),D061_SCSID(317), D055_SCSID(318), D058_SCSID(319), D056_SCSID(320),D083_NDISS(321), D078_TDOIC(322), D079_TRSTI(323), D084_TESTH(324),D093_TDI(325), D077_TDIIC(326), D090_TCK(329), D091_TMS(330),D085_TESTA(331), D096_PVT1(333), D088_NTEST(335), D086_M66EN(336),D099_NINTA(337), D094_TDO(338), D101_NALTI(341), D100_NINTB(343),D106_NPCIG(346), D103_NPCIR(347), D109_PCIAD(348), D108_PCIAD(349),D102_NALTI(350), D119_PCIAD(353), D107_NPCIR(354), D116_PCIAD(355),D111_PCIAD(356), D122_PCIAD(357), D112_PCIAD(358), D114_PCIAD(359),D113_PCIAD(360), D129_PCIAD(361), D115_PCIAD(362), D130_NPCIC(363),D121_PCIAD(365), D117_NPCIC(366), D120_PCIAD(367), D118_PCIID(368),D134_NPCID(369), D135_NPCIS(371), D126_PCIAD(372), D132_NPCII(373),D131_NPCIF(374), D128_PCIAD(376), D243_MAD_8(377), D239_MAD_1(378),D246_MAD_1(379), D235_MAD_4(380), D250_MAD_1(381), D233_MAD_6(382),D247_MAD_1(383), D241_NRAMW(384) Here the user sets the RMA pin list tothe pins of interest. break> pinl rma = 191,246,337 pinlist RMA is beingsuperseded This section shows how the user invokes the FAQuest softwareusing a three character short cut. Some simple instructions aredisplayed through out the run and the user provides the appropriateselections or inputs for the device under test. break> faq ←----------User invokes FAQuest For options 1 and 2 you must already be paused onthe pattern of interest For option 3 you must be paused on thefunctional continuity test. If you are not paused as required, chooseoption 4 to exit this menu to get to the required pause location. Inaddition, options 1 and 3 use a user defined pinlist RMA that isinitially set to ALLPIN. You can update the RMA pinlist by using theinteractive pinl command prior to using options 1 and 3 of this routine.Note: In many menus if you enter a −1 it will return you to the testprogram flow. Enter a 1 for ATESignature scan analysis. Enter a 2 forATEPattern changing analysis. Enter a 3 for ATECurve tracing analysis.Enter a 4 to return to the program. Enter your selection: 3 ←----------User selects the ATECurve option.  The curve trace data will be saved toa file in  both row and column format for data manuipulation  and/or usein spreadsheet software.  Do not make the file name the same as theprogram name.  Enter a file name where your data will bestored:attachment2.txt ←--------      User inputs filename where datawill be stored.  Remember you can update the RMA pinlist interactively on the tester by using the pinl command. This is  a very easy processand can be used as many times  as you want in between executions of thisutility.  You can also use the gnuplot utility on the tester  to plotthe curve traces during your test session.  This utility will save afile for each pin in the  format that gnuplot requires; in addition itwill  create a file called “ct” for easy pasting  of the plot command tothe gnu_plot utility.  Will you use the gnuplot utility? [0=no, 1=yes]:1 ←---------- User option. The file attachment2.txt has been opened. The3 pins that were selected are processed, and the information has beensave to the appropriate files. The files are included in Attachment 3and the plots are included in Attachment 4. Pin  1 of 3 being processed:pin =  D199_PCIAD(P191) Pin  2 of 3 being processed: pin=  D262_SCSID(P246) Pin  3 of 3 being processed: pin =  D099_NINTA(P337)break>

TABLE 7 This is an example of one of the UNIX “gnuplot” utility pin(buffer) data files created by the ATECurve program. #VoltageD099_NINTA(P337) −0.510 −0.000125 −0.500 −0.000097 −0.490 −0.000072−0.480 −0.000053 −0.470 −0.000038 −0.460 −0.000028 −0.450 −0.000020−0.440 −0.000014 −0.430 −0.000010 −0.420 −0.000007 −0.410 −0.000005−0.400 −0.000004 −0.390 −0.000003 −0.380 −0.000002 −0.370 −0.000001−0.360 −0.000001 −0.350 −0.000001 −0.340 −0.000000 −0.330 −0.000000−0.320 −0.000000 −0.310 −0.000000 −0.300 −0.000000 −0.290 −0.000000−0.280 −0.000000 −0.270 −0.000000 −0.260 −0.000000 −0.250 −0.000000−0.240 −0.000000 −0.230 −0.000000 −0.220 −0.000000 −0.210 −0.000000−0.200 −0.000000 −0.190 −0.000000 −0.180 −0.000000 −0.170 −0.000000−0.160 −0.000000 −0.150 −0.000000 −0.140 −0.000000 −0.130 −0.000000−0.120 −0.000000 −0.110 −0.000000 −0.100 −0.000000 −0.090 −0.000000−0.080 −0.000000 −0.070 −0.000000 −0.060 −0.000000 −0.050 −0.000000−0.040 +0.000000 −0.030 −0.000000 −0.020 +0.000000 −0.010 −0.0000000.000 +0.000000 0.010 +0.000000 0.020 +0.000000 0.030 +0.000000 0.040+0.000000 0.050 +0.000000 0.060 +0.000000 0.070 +0.000000 0.080+0.000000 0.090 +0.000000 0.100 +0.000000 0.110 +0.000000 0.120+0.000000 0.130 +0.000000 0.140 +0.000000 0.150 +0.000000 0.160+0.000000 0.170 +0.000000 0.180 +0.000000 0.190 +0.000000 0.200+0.000000 0.210 +0.000000 0.220 +0.000000 0.230 +0.000000 0.240+0.000000 0.250 +0.000000 0.260 +0.000000 0.270 +0.000000 0.280+0.000000 0.290 +0.000000 0.300 +0.000000 0.310 +0.000000 0.320+0.000000 0.330 +0.000000 0.340 +0.000000 0.350 +0.000000 0.360+0.000000 0.370 +0.000000 0.380 +0.000000 0.390 +0.000000 0.400+0.000000 0.410 +0.000000 0.420 +0.000000 0.430 +0.000000 0.440+0.000000 0.450 +0.000000 0.460 +0.000000 0.470 +0.000000 0.480+0.000000 0.490 +0.000000 0.500 +0.000000 0.510 +0.000000 0.520+0.000001 0.530 +0.000001 0.540 +0.000001 0.550 +0.000001 0.560+0.000002 0.570 +0.000003 0.580 +0.000004 0.590 +0.000006 0.600+0.000008 0.610 +0.000012 0.620 +0.000017 0.630 +0.000025 0.640+0.000036 0.650 +0.000053 0.660 +0.000077 0.670 +0.000112 This is anexample of the command file generated by ATECurve and used to invoke theUNIX “gnuplot” utility. set xlabel “Voltage(V)” set ylabel “Current(A)” plot “D199_PCIAD(P191)” with lines, “D262_SCSID(P246)” with lines,“D099_NINTA(P337)” with lines pause −1 “Take snapshot or return to exit”This an example of the txt file created by ATECurve. It containsinformation that can be read by other offline utilities such as MathCadand Microsoft EXCEL for further data analysis and curve plotting. Thedata is first provided in row format and then the same data is providedin column format. The user can select the format of their choice. Thedata (+200.00000) is included as place holders that keep all dataaligned structural purposed. They are discarded after the data is readby the analysis tool. Test Date: Aug 18 2004 Test Time: 08:20:26 Thistest is: BLK_OS_FUN_CON Tester:   QRT1 Note: This is the row formattedsection however it is page wrapped. The data is actually in rows ofcontinues data for each pin. Pin names followed by * may be suspect.pinnamehere −1.000000 −0.990000 −0.980000 −0.970000 −0.960000 −0.950000−0.940000 −0.930000 −0.920000 −0.910000 −0.900000 −0.890000 −0.880000−0.870000 −0.860000 −0.850000 −0.840000 −0.830000 −0.820000 −0.810000−0.800000 −0.790000 −0.780000 −0.770000 −0.760000 −0.750000 −0.740000−0.730000 −0.720000 −0.710000 −0.700000 −0.690000 −0.680000 −0.670000−0.660000 −0.650000 −0.640000 −0.630000 −0.620000 −0.610000 −0.600000−0.590000 −0.580000 −0.570000 −0.560000 −0.550000 −0.540000 −0.530000−0.520000 −0.510000 −0.500000 −0.490000 −0.480000 −0.470000 −0.460000−0.450000 −0.440000 −0.430000 −0.420000 −0.410000 −0.400000 −0.390000−0.380000 −0.370000 −0.360000 −0.350000 −0.340000 −0.330000 −0.320000−0.310000 −0.300000 −0.290000 −0.280000 −0.270000 −0.260000 −0.250000−0.240000 −0.230000 −0.220000 −0.210000 −0.200000 −0.190000 −0.180000−0.170000 −0.160000 −0.150000 −0.140000 −0.130000 −0.120000 −0.110000−0.100000 −0.090000 −0.080000 −0.070000 −0.060000 −0.050000 −0.040000−0.030000 −0.020000 −0.010000 +0.000000 +0.010000 +0.020000 +0.030000+0.040000 +0.050000 +0.060000 +0.070000 +0.080000 +0.090000 +0.100000+0.110000 +0.120000 +0.130000 +0.140000 +0.150000 +0.160000 +0.170000+0.180000 +0.190000 +0.200000 +0.210000 +0.220000 +0.230000 +0.240000+0.250000 +0.260000 +0.270000 +0.280000 +0.290000 +0.300000 +0.310000+0.320000 +0.330000 +0.340000 +0.350000 +0.360000 +0.370000 +0.380000+0.390000 +0.400000 +0.410000 +0.420000 +0.430000 +0.440000 +0.450000+0.460000 +0.470000 +0.480000 +0.490000 +0.500000 +0.510000 +0.520000+0.530000 +0.540000 +0.550000 +0.560000 +0.570000 +0.580000 +0.590000+0.600000 +0.610000 +0.620000 +0.630000 +0.640000 +0.650000 +0.660000+0.670000 +0.680000 +0.690000 +0.700000 +0.710000 +0.720000 +0.730000+0.740000 +0.750000 +0.760000 +0.770000 +0.780000 +0.790000 +0.800000+0.810000 +0.820000 +0.830000 +0.840000 +0.850000 +0.860000 +0.870000+0.880000 +0.890000 +0.900000 +0.910000 +0.920000 +0.930000 +0.940000+0.950000 +0.960000 +0.970000 +0.980000 +0.990000 +1.000000D199_PCIAD(P191) +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 −0.000122 −0.000099 −0.000074−0.000054 −0.000039 −0.000028 −0.000020 −0.000014 −0.000010 −0.000008−0.000005 −0.000004 −0.000003 −0.000002 −0.000001 −0.000001 −0.000001−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000+0.000000 +0.000000 −0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000001 +0.000001 +0.000001 +0.000001 +0.000002+0.000003 +0.000004 +0.000006 +0.000008 +0.000012 +0.000018 +0.000026+0.000037 +0.000054 +0.000079 +0.000114 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 D262_SCSID(P246) +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000−0.000120 −0.000099 −0.000082 −0.000065 −0.000051 −0.000040 −0.000032−0.000025 −0.000020 −0.000016 −0.000013 −0.000010 −0.000008 −0.000008−0.000006 −0.000005 −0.000003 −0.000003 −0.000002 −0.000001 −0.000001−0.000001 −0.000001 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 D099_NINTA(P337) +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 −0.000125−0.000097 −0.000072 −0.000053 −0.000038 −0.000028 −0.000020 −0.000014−0.000010 −0.000007 −0.000005 −0.000004 −0.000003 −0.000002 −0.000001−0.000001 −0.000001 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000 −0.000000−0.000000 −0.000000 −0.000000 −0.000000 +0.000000 −0.000000 +0.000000−0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000 +0.000000+0.000000 +0.000000 +0.000000 +0.000000 +0.000001 +0.000001 +0.000001+0.000001 +0.000002 +0.000003 +0.000004 +0.000006 +0.000008 +0.000012+0.000017 +0.000025 +0.000036 +0.000053 +0.000077 +0.000112 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 +200.000000 +200.000000 +200.000000 +200.000000+200.000000 +200.000000 This ends the section of page wrapped rowformatted data and starts the column format of the same data. VoltageD199_PCIAD(P191) D262_SCSID(P246) D099_NINTA(P337) −1.000 +200.000000+200.000000 +200.000000 −0.990 +200.000000 +200.000000 +200.000000−0.980 +200.000000 +200.000000 +200.000000 −0.970 +200.000000+200.000000 +200.000000 −0.960 +200.000000 +200.000000 +200.000000−0.950 +200.000000 +200.000000 +200.000000 −0.940 +200.000000+200.000000 +200.000000 −0.930 +200.000000 +200.000000 +200.000000−0.920 +200.000000 +200.000000 +200.000000 −0.910 +200.000000+200.000000 +200.000000 −0.900 +200.000000 +200.000000 +200.000000−0.890 +200.000000 +200.000000 +200.000000 −0.880 +200.000000+200.000000 +200.000000 −0.870 +200.000000 +200.000000 +200.000000−0.860 +200.000000 +200.000000 +200.000000 −0.850 +200.000000+200.000000 +200.000000 −0.840 +200.000000 +200.000000 +200.000000−0.830 +200.000000 +200.000000 +200.000000 −0.820 +200.000000+200.000000 +200.000000 −0.810 +200.000000 +200.000000 +200.000000−0.800 +200.000000 +200.000000 +200.000000 −0.790 +200.000000+200.000000 +200.000000 −0.780 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+200.000000+0.000000 +200.000000 0.830 +200.000000 +0.000000 +200.000000 0.840+200.000000 +0.000000 +200.000000 0.850 +200.000000 +0.000000+200.000000 0.860 +200.000000 +0.000000 +200.000000 0.870 +200.000000+0.000000 +200.000000 0.880 +200.000000 +0.000000 +200.000000 0.890+200.000000 +0.000000 +200.000000 0.900 +200.000000 +0.000000+200.000000 0.910 +200.000000 +0.000000 +200.000000 0.920 +200.000000+0.000000 +200.000000 0.930 +200.000000 +0.000000 +200.000000 0.940+200.000000 +0.000000 +200.000000 0.950 +200.000000 +0.000000+200.000000 0.960 +200.000000 +0.000000 +200.000000 0.970 +200.000000+0.000000 +200.000000 0.980 +200.000000 +0.000000 +200.000000 0.990+200.000000 +0.000000 +200.000000 1.000 +200.000000 +0.000000+200.000000

TABLE 8 The follow sections were extracted from an actual productiontest program run on a bad part and a good part. Both parts passed theopens and shorts test sections of the continuity test. However, the badpart actually has a resistive short on pin 44 (P44). ATECurvedemonstrates that there is a resistive short on the bad part and is ableto detect this problem See the charts following this data log example.Bad part OPEN_NEG D187_N_ISC P448 −2.000 −467.2 mV 1.000 365 passOPEN_NEG D287_N_GNT P31 −2.000 −547.9 mV 1.000 365 pass OPEN_NEGD291_IDSEL P44 −2.000 −574.9 mV 1.000 365 pass OPEN_NEG D021_N_LOC P259−2.000 −547.9 mV 1.000 365 pass OPEN_NEG D285_PCICL P25 −2.000 −547.9 mV1.000 365 pass . . . SHORT D289_PCIAD P41 −3.000 −550.4 mV −100.0 m 365pass SHORT D288_PCIAD P42 −3.000 −547.9 mV −100.0 m 365 pass SHORTD291_IDSEL P44 −3.000 −574.9 mV −100.0 m 365 pass SHORT D010_N_CBE P49−3.000 −545.5 mV −100.0 m 365 pass SHORT D292_PCIAD P50 −3.000 −547.9 mV−100.0 m 365 pass . . . BLKA_MAX 376 to 69783 *FAIL*    LOW FAIL = .  HIGH FAIL = /  TRISTATE FAIL = *  SX:NO COMPARE = - Vector Loop Cycle FAILED DUT PIN 500 0 125 .D020_N_DEV Pause in “BLKA_MAX” due tofunctional fail func_test(func_pins = OBPIN, start_vec = 376, stop_vec =69783) Good part OPEN_NEG D187_N_ISC P448 −2.000 −477.0 mV 1.000 365pass OPEN_NEG D287_N_GNT P31 −2.000 −552.8 mV 1.000 365 pass OPEN_NEGD291_IDSEL P44 −2.000 −552.8 mV 1.000 365 pass OPEN_NEG D021_N_LOC P259−2.000 −552.8 mV 1.000 365 pass OPEN_NEG D285_PCICL P25 −2.000 −555.3 mV1.000 365 pass . . . SHORT D289_PCIAD P41 −3.000 −555.3 mV −100.0 m 365pass SHORT D288_PCIAD P42 −3.000 −552.8 mV −100.0 m 365 pass SHORTD291_IDSEL P44 −3.000 −552.5 mV −100.0 m 365 pass SHORT D010_N_CBE P49−3.000 −555.3 mV −100.0 m 365 pass SHORT D292_PCIAD P50 −3.000 −550.4 mV−100.0 m 365 pass

While embodiments of the present invention is shown and described, it isenvisioned that those skilled in the art may devise variousmodifications of the present invention without departing from the spiritand scope of the appended claims.

1. A method to curve trace device buffers on an ATE, said methodcomprising the steps of: a) defining a predetermined pin list which isset to include all pins during pattern loads; b) modifying saidpredetermined pin list using a predetermined debugger command in orderto include desired pins for characterization using an appropriatecomputer program; c) having said appropriate computer program query auser regarding a plurality of items; d) reading one of said pins fromsaid predetermined pin list; e) using pin measurement units to forceincrementally increasing voltage from zero volts until a predefinedmaximum current limit is reached; f) flagging any problem pinsidentified in step (e) and storing values at each increment to datafiles; g) using pin measurement units to force incrementally decreasingvoltage from zero to a predefined minimum current limit is reached; h)flagging any problem pins identified in step (g) and storing values ateach increment to data files; and i) if all of said pins in saidpredetermined pin list have not been evaluated, returning to step (d).2. A method as defined in claim 1, wherein said appropriate computerprogram queries the user regarding a filename where data will be storedin step (c).
 3. A method as defined in claim 1, wherein said appropriatecomputer program queries the user as to whether a UNIX GNUPLOT utilitywill be used in step (c).